AYEDAS™
Experiment
Analysis
The continuous process improvement comes from the
verified results of engineering trials. Therefore accurate
and quick experimental analysis and results interpretation becomes
essential for accelerating yield ramps.
AYEDAS Experiment Analysis allows all this to be
done easily and automatically. Simply input the experiment
split condition / table, the output is then grouped
by splits with the statistical results show you instantly
how the each split performed.
Different output chart types are available to you
when different issues are to be focused on.
AYEDAS™
Generic
Reporting
TYNE
EDA serves all the typical statistical plots such
as trends, capability plots, scatter charts, bar
charts, box plots, pareto. All of these generic
charts are available as an
option when you perform any one of the TYNE EDA functions
.
Save the plots to a file for information
sharing, re-scale the axis, edit plot title, add comments,
etc. are available in all the
TYNE EDA
functions. Alternatively save the extract as a batch
job for automatic running every morning to be ready
for you.
TYNE
WAT mapping function enables the User to review the wafer maps
of WAT measurement results. Multiple wafer selections allows
you to review all selected wafer maps with one WAT parameter
measurement result in one screen. Alternatively you can
display multiple wafer
maps of each WAT parameter result .
The
most fundamental EDA capability is the ability to verify
possible relations between Yield variables, Electrical test and
key in-line parameters. AYEDAS loads all data
types (In-line, Defect, ETest, Wafer Test & Final Test) and
allows the engineers to extract weeks of data (e.g. Yield) and
correlate it against any data type.
