LRCS™
Not
an EDA Replacement
LRCS is designed to compliment your existing EDA system
and maximise its potential. At the same time,
increase the analysis productivity of the Engineering
Team in generating new Yield Improvement initiatives. Pre-generating all the reports frees up Engineering time
to focus on Improvements.
Reporting All data types: LRCS processes all the usual data
sources (Inline, WAT, Wafer Test, Defect data and Final Test) to
provide the outputs of choice, with Lot maps and Reports being the most
logical starting point for Lot review.
LRCS™
An
Event Management System
The Lot Reports are the basis for the Engineering teams
understanding of the health of the Product. However, to
improve that Product, the team needs to know the various
loss mechanisms, and their impact, to prioritise Improvement
activities. This is where LRCS comes into its own, providing
Signature classification and Debug workflows.
Should a new signature be detected, the User
initiates the Signature Knowledge Management system
to describe the failure mode, attach maps and any
relevant files and drive the necessary workflow.
LRCS™
Information
Exchange
Once several days of production has been classified,
the Users can get an overview of the on-going
losses.
By drilling down on the Signature, it is
possible for the User to review the
Signature debug status, update the progress,
or obtain a current “affected” lot list for
Commonality and Quarantine purposes.
